发明名称 |
SOLID-STATE IMAGING APPARATUS AND CAMERA |
摘要 |
PROBLEM TO BE SOLVED: To provide a MOS type solid-state imaging apparatus that can properly set gate potential of a read transistor and a reset transistor and prevent reduction in a saturated electric charge caused by a coupling capacitance and malfunction wherein a non-selection row is erroneously selected. SOLUTION: The solid-state imaging apparatus is provided with a potential setting section 50 that sets a Low level of a gate of an N-type read section 2 lower than a potential 18 of a P-type well 13 of an imaging region under the gate of the read section 2 and higher than a potential 19 of a P-type well 14 in a peripheral circuit region in order to prevent reduction in the saturated electric charge, and with a potential setting section 50 that sets a Low level of a gate of an N-type reset section 3 lower than the potential 18 of the P-type well 13 of the imaging region under the gate of the reset section 3 and higher than the potential 19 of the P-type well 14 in the peripheral circuit region in order to prevent malfunction wherein a non-selection row is erroneously selected. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005072795(A) |
申请公布日期 |
2005.03.17 |
申请号 |
JP20030297766 |
申请日期 |
2003.08.21 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YAMAGUCHI TAKUMI;KASUGA SHIGETAKA;MURATA TAKAHIKO |
分类号 |
H01L27/146;H04N5/335;H04N5/355;H04N5/369;H04N5/374;H04N101/00;(IPC1-7):H04N5/335 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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