发明名称 |
APPARATUS AND METHOD FOR CLEANING SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and a method for cleaning a semiconductor substrate, which prevent IPA vapor from condensing in a chamber and can efficiently dry the wafer. SOLUTION: This invention is related to an apparatus and a method for cleaning a semiconductor substrate. The apparatus has a chamber equipped with an exhaust path through which IPA vapor that flows into the inside is discharged. The opening rate of the exhaust path is adjusted according to the pressure in the chamber during processing. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005072598(A) |
申请公布日期 |
2005.03.17 |
申请号 |
JP20040243829 |
申请日期 |
2004.08.24 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
PARK SANG-O;YI HUN-JUNG |
分类号 |
H01L21/304;B08B3/02;B08B3/04;B08B3/10;F26B5/16;H01L21/00;H01L21/302;H01L21/306;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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