发明名称 |
Fast etching system and process for organic materials |
摘要 |
Plasma reactor and process for very fast etching of organic materials in which a workpiece is placed on a pedestal in a chamber, gas is exhausted from the chamber, an oxidizing gas is introduced into the chamber through a showerhead electrode which is spaced from the pedestal by a distance on the order of 1.0 to 1.5 cm, RF power is applied to the pedestal and/or the showerhead electrode, and pressure within the chamber is maintained at a level on the order of 3 to 15 Torr while an organic material is removed from the workpiece.
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申请公布号 |
US2005059250(A1) |
申请公布日期 |
2005.03.17 |
申请号 |
US20040890396 |
申请日期 |
2004.07.13 |
申请人 |
SAVAS STEPHEN EDWARD;ZAJAC JOHN |
发明人 |
SAVAS STEPHEN EDWARD;ZAJAC JOHN |
分类号 |
H01L21/302;H01L21/3065;H01L21/311;(IPC1-7):H01L21/311 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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