| 摘要 |
A semi-conductor component test procedure, as well as a system for testing semi-conductor components. The invention relates to a semi-conductor component test procedure, as well as a system for testing semi-conductor components (3a, 3b, 3c, 3d), by means of a first and a second test apparatus (6a, 6b), whereby the first test apparatus (6a) is arranged and installed such that a time-discrete semi-conductor component test is performed by it on a particular semi-conductor component (3a), and whereby the second test apparatus (6a) is arranged and installed such that a separate, time-continuous semi-conductor component test is performed by it on the same semi-conductor component (3a).
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