发明名称 |
FLUORESCENT X-RAY ANALYZER |
摘要 |
<p>A fluorescent X-ray analyzer for analyzing a sample in an inert gas atmosphere, wherein a spectral chamber need not be substituted with an inert gas, does not communicate with a sample chamber, and can provide a sufficiently intensive secondary X-ray and an analyzer having a long-life partition. The analyzer comprises a sample chamber (1) for storing a sample (4), an irradiation chamber (2) for storing an X-ray source (7) for applying a primary X-ray (6) to the sample (4) and communicating with the sample chamber (1), a spectral chamber (3) for storing a detection means (9) that spectrally separates and detects a secondary X-ray (8) generated from the sample (4), and a partition (10) disposed so as to partition the irradiation chamber (2) from the spectral chamber (3) and allowing the secondary X-ray (8) to pass therethrough, wherein the sample chamber (1) and the irradiation chamber (2) are substituted with an inert gas, and the spectral chamber (3) is vacuum-evacuated.</p> |
申请公布号 |
WO2005024407(A1) |
申请公布日期 |
2005.03.17 |
申请号 |
WO2004JP04738 |
申请日期 |
2004.03.31 |
申请人 |
RIGAKU INDUSTRIAL CORPORATION;SUMII, KOUSHI;AOYAGI, KOUICHI |
发明人 |
SUMII, KOUSHI;AOYAGI, KOUICHI |
分类号 |
G01N23/223;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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