发明名称 A SELECTIVE ETCH PROCESS FOR MAKING A SEMICONDUCTOR DEVICE HAVING A HIGH-K GATE DIELECTRIC
摘要 A method for making a semiconductor device is described. That method comprises forming a high-k gate dielectric layer on a substrate, and modifying a first portion of the high-k gate dielectric layer to ensure that it may be removed selectively to a second portion of the high-k gate dielectric layer.
申请公布号 WO2005024929(A1) 申请公布日期 2005.03.17
申请号 WO2004US27747 申请日期 2004.08.25
申请人 INTEL CORPORATION (A DELAWARE CORPORATION);BRASK, JUSTIN;SHAH, UDAY;DOCZY, MARK;KAVALIEROS, JACK;CHAU, ROBERT;TURKOT, ROBERT, JR.;METZ, MATTHEW 发明人 BRASK, JUSTIN;SHAH, UDAY;DOCZY, MARK;KAVALIEROS, JACK;CHAU, ROBERT;TURKOT, ROBERT, JR.;METZ, MATTHEW
分类号 H01L21/336;H01L21/311 主分类号 H01L21/336
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