Probe for testing circuits, and associated methods

摘要

A connector-less probe is disclosed. The probe permits probing of a board or bus without the use of a mating connector. The probe has a support attached to the probing end of the probe. A spring pin and an isolation network are attached to the support. The support is arranged substantially perpendicular to a target board during probing of a test point on the target board. The spring pin engages the test point on the target board. The spring pin is arranged substantially perpendicular to the target board when the spring pin engages the test point on the target board, and the spring pin is securely attached to the support so that the spring pin is substantially parallel to the support. The isolation network is electrically coupled to the spring pin so that the spring pin is located between the isolation network and the test point during probing of the test point. The isolation network is also securely attached to the support.