发明名称 Semiconductor integrated circuit tester with pivoting interface unit
摘要 A semiconductor integrated circuit tester includes a generally parallelepipedal housing, a main tester board in the housing, and an interface unit incorporating a tester interface that is connected to the main tester board. A support mechanism supports the interface unit in a manner allowing pivotal movement of the interface unit relative to the housing.
申请公布号 US6867578(B1) 申请公布日期 2005.03.15
申请号 US20020234496 申请日期 2002.09.03
申请人 CREDENCE SYSTEMS CORPORATION 发明人 MILLER WAYNE H.
分类号 G01R31/28;(IPC1-7):G01R31/00 主分类号 G01R31/28
代理机构 代理人
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