发明名称 Vertical double diffused MOSFET and method of fabricating the same
摘要 In a DMOS device, a drift region is located over a substrate and is lightly doped with impurities of a first conductivity type. A plurality of body areas are located in the drift region and doped with impurities of a second conductivity type which is opposite the first conductivity type. A plurality of source areas are respectively located in the body areas and heavily doped with impurities of the first conductivity type. A plurality of bulk areas are respectively located adjacent the source areas and in the body areas, and are heavily doped with impurities of the second conductivity type. A well region partially surrounds the body areas collectively and is doped with impurities of the first conductivity.
申请公布号 US6867476(B2) 申请公布日期 2005.03.15
申请号 US20030396348 申请日期 2003.03.26
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 LEE SUN-HAK
分类号 H01L21/336;H01L29/06;H01L29/08;H01L29/78;(IPC1-7):H01L29/00 主分类号 H01L21/336
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