发明名称 METHOD FOR DYNAMICALLY MEASURING SUSPENSION IN-PLANE AND OUT-PLANE THERMAL DRIFT IN HARD DISK DRIVES
摘要 A method for dynamically measure a thermal drift in accordance with in-plane and out-plane temperature changes of a suspension in a hard disk drive is provided to exactly measure a thermal drift in accordance with in-plane and out-plane temperature changes of a suspension by using a dynamic interaction of a head-disk interface, thereby featuring an original position. In an initial state(102), the first data track is recorded while a disk of a hard disk drive rotates one time(104). A track center of the first data track is determined(106). Data tracks are recorded for a predetermined time(108), and a new track center of a final data track is determined(110). A size and a size change of a recording data signal on the final data track are measured(112). A track center of the final data track is compared with the track center of the first data track(114). The size and the size change of the measured recording data signal are compared with a size and a size change of a recording data signal measured when the final data track is recorded(116).
申请公布号 KR20050025563(A) 申请公布日期 2005.03.14
申请号 KR20040070622 申请日期 2004.09.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 GENG, WANG;LEE, SANG YEOP
分类号 G11B21/21;G11B5/02;G11B5/596;G11B21/02;G11B27/36;(IPC1-7):G11B21/21 主分类号 G11B21/21
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