发明名称 CMP APPARATUS FOR PREVENTING MOVEMENT OF PARTICLES AND PIECES OF BROKEN WAFER AND PERFORMING NORMALLY WAFER POLISHING PROCESS
摘要 PURPOSE: A CMP apparatus is provided to prevent damage of other wafers due to pieces and particles of a broken wafer in wafer polishing process by blocking the movement of the particles of the broken wafer. CONSTITUTION: A CMP apparatus includes an HCLU(Head Cup Loading Unloading) part(10) as a loading/unloading location of a wafer, a plurality of pads(20), and a plurality of polishing heads(40) located at upper parts of the HCLU part and the pads. A plurality of isolation parts are formed between the HCLU and the pads. The isolation parts are elevated by a driving device. The isolation parts are formed with barrier members of vertical flat plates.
申请公布号 KR20050024634(A) 申请公布日期 2005.03.11
申请号 KR20030060698 申请日期 2003.09.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, JONG MUK
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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