发明名称 |
CMP APPARATUS FOR PREVENTING MOVEMENT OF PARTICLES AND PIECES OF BROKEN WAFER AND PERFORMING NORMALLY WAFER POLISHING PROCESS |
摘要 |
PURPOSE: A CMP apparatus is provided to prevent damage of other wafers due to pieces and particles of a broken wafer in wafer polishing process by blocking the movement of the particles of the broken wafer. CONSTITUTION: A CMP apparatus includes an HCLU(Head Cup Loading Unloading) part(10) as a loading/unloading location of a wafer, a plurality of pads(20), and a plurality of polishing heads(40) located at upper parts of the HCLU part and the pads. A plurality of isolation parts are formed between the HCLU and the pads. The isolation parts are elevated by a driving device. The isolation parts are formed with barrier members of vertical flat plates.
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申请公布号 |
KR20050024634(A) |
申请公布日期 |
2005.03.11 |
申请号 |
KR20030060698 |
申请日期 |
2003.09.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, JONG MUK |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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