发明名称 |
THIN FILM FORMATION METHOD, AND PARTICLE NUMBER EVALUATING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin film formation method capable of decreasing the number of particles on a substrate, and a particle number evaluating method. SOLUTION: In a process of introducing film formation gas and forming a film by CVD, a temperature in a route to the inside of a shower head at the upper place of a reaction chamber from the system including a vaporization system is set at a temperature which is not lower than a vaporization temperature but not higher than a decomposition temperature of at least one of materials and where the number of particles generated during the film formation process reaches the minimum. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005064264(A) |
申请公布日期 |
2005.03.10 |
申请号 |
JP20030292822 |
申请日期 |
2003.08.13 |
申请人 |
ULVAC JAPAN LTD |
发明人 |
MASUDA TAKESHI;KAJINUMA MASAHIKO;NISHIOKA HIROSHI;YAMADA KIICHI;UEMATSU MASANORI;SUU KOUKO |
分类号 |
C23C16/455;H01L21/31;H01L21/316;H01L21/66;(IPC1-7):H01L21/31 |
主分类号 |
C23C16/455 |
代理机构 |
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地址 |
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