发明名称 THIN FILM FORMATION METHOD, AND PARTICLE NUMBER EVALUATING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a thin film formation method capable of decreasing the number of particles on a substrate, and a particle number evaluating method. SOLUTION: In a process of introducing film formation gas and forming a film by CVD, a temperature in a route to the inside of a shower head at the upper place of a reaction chamber from the system including a vaporization system is set at a temperature which is not lower than a vaporization temperature but not higher than a decomposition temperature of at least one of materials and where the number of particles generated during the film formation process reaches the minimum. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005064264(A) 申请公布日期 2005.03.10
申请号 JP20030292822 申请日期 2003.08.13
申请人 ULVAC JAPAN LTD 发明人 MASUDA TAKESHI;KAJINUMA MASAHIKO;NISHIOKA HIROSHI;YAMADA KIICHI;UEMATSU MASANORI;SUU KOUKO
分类号 C23C16/455;H01L21/31;H01L21/316;H01L21/66;(IPC1-7):H01L21/31 主分类号 C23C16/455
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