发明名称 TEST RESULT PREDICTION PROGRAM AND TEST RESULT PREDICTION APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a test result predicting program for performing a test by using a statistical method to be performed in the manufacturing process of products, the program in which the test result is calculated as an area corresponding to the fluctuation of a parameter for the test. <P>SOLUTION: A test result prediction apparatus 1 calculates the value of a test parameter group to be used for the test based on inputted observation data (a step S1). Then, an arbitrary test parameter is selected from the calculated test parameter group, and the parameter value is developed within a predetermined range including a value calculated from observation data (a step S2). Then, a developed parameter group corresponding to set a plurality of parameter values is generated. Then, test statistical quantity is calculated for each developed parameter group, and the test is performed. Then, the test result is related with the parameter-developed arbitrary test parameter, so that the test result prediction information related with the parameter-developed arbitrary test parameter can be generated (a step S3). <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005063260(A) 申请公布日期 2005.03.10
申请号 JP20030294256 申请日期 2003.08.18
申请人 FUJITSU LTD 发明人 YAMASHITA SHINJI
分类号 G05B19/418;G06F17/18;(IPC1-7):G05B19/418 主分类号 G05B19/418
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