发明名称 Interferometric measuring device for recording geometric data for surfaces
摘要 An interferometric measuring device for recording geometric data for surfaces of at least one object, including a beam supply section including a modulation interferometer fed by a light source including temporarily coherent broadband radiation, a measuring interferometer system that is connected thereto and includes a plurality of probe units for emitting radiation of measuring beams onto the assigned surface locations and recording the radiation reflected by the surface locations, the radiation forming interference with radiation reflected by a related reference element system, and including a downstream receiving and evaluation device for determining geometric data on the basis of the interfering radiation. A reduced expenditure with respect to operation and configuration is achieved in that a uniform platform, which also includes the receiving and evaluation device and an interface configuration to which the various probe units are optionally connectable, is formed from the beam inlet section including the modulation interferometer, and the modulation interferometer and the receiving and evaluation device are configured such that the various probe units are operable from the same platform and the interfering radiation is evaluatable.
申请公布号 US2005052656(A1) 申请公布日期 2005.03.10
申请号 US20040920135 申请日期 2004.08.17
申请人 LINDNER MICHAEL;SCHMIDTKE BERND 发明人 LINDNER MICHAEL;SCHMIDTKE BERND
分类号 G01B9/02;G01B11/24;G01B11/30;(IPC1-7):G01B9/02 主分类号 G01B9/02
代理机构 代理人
主权项
地址