发明名称 Photo-mask process and method for manufacturing a thin film transistor using the process
摘要 A photo-mask process includes the steps of: spreading a film of photo resist on a carrier (30, 50), exposing the photo resist using a mask with a predefined pattern, developing the photo resist to obtain a photo resist layer (36, 60) with the predefined pattern, depositing a layer of predetermined material on the photo resist layer and the carrier, and removing the photo resist layer and the layer of predetermined material thereon. The photo-mask process can omit a conventional etching process. That is, the photo-mask process is simplified, and its cost is lower than that of conventional photo-mask processes. A related method for manufacturing a thin film transistor is also provided.
申请公布号 US2005054146(A1) 申请公布日期 2005.03.10
申请号 US20040818904 申请日期 2004.10.21
申请人 CHEN YUNG-CHANG;PANG JIA-PANG;LAI CHIEN-TING 发明人 CHEN YUNG-CHANG;PANG JIA-PANG;LAI CHIEN-TING
分类号 G02F1/1368;H01L21/027;H01L21/336;H01L21/768;H01L21/77;H01L21/84;H01L29/786;(IPC1-7):H01L21/00;H01L21/44 主分类号 G02F1/1368
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