test system for testing jitter of high speed data output device and total jitter testing method,申请号KR20020043475-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	test system for testing jitter of high speed data output device and total jitter testing method
摘要
申请公布号	KR100471006(B1)	申请公布日期	2005.03.10
申请号	KR20020043475	申请日期	2002.07.24
申请人		发明人
分类号	G01R29/02;G01R31/28;G01R31/317;G01R31/319;G06F11/24;G06F11/30;G06F15/00;H04L25/02;(IPC1-7):G01R31/28	主分类号	G01R29/02
代理机构		代理人
主权项
地址

您可能感兴趣的专利

2-HYDROXYCYCLOHEXYL ESTERS

NAIL STRENGTHENER

PROCESS FOR THE MANUFACTURE OF COPOLYMERS HAVING AN EXTREMELY HETEROGENEOUS STRUCTURE

PROCESS FOR THE PREPARATION OF NITRILES

APPARATUS FOR TREATING PLASTIC SURFACES

PROCESS OF TETRACYCLINE PRODUCTION BY FERMENTATION

DISPLACING FLUIDIZED MATERIAL INTO COATING SPACE AND WITHDRAWING SAME

COATING APPARATUS

APPARATUS FOR MAKING THICK POLYMERIC ARTICLES

FLUORESCENT LUMINAIRE

METHOD AND APPARATUS FOR CENTRIFUGING AND TREATING LIQUID MIXTURES

PNEUMATICALLY ACTUATED VENDING MECHANISM

MACHINE AND METHOD FOR HANDLING CLASSIFIABLE MATERIALS

WELL SCRAPING TOOL

MATRIX SWITCHING SYSTEM

PILOT-TONE CHAIN FOR FM STEREO RECEIVER

BEAM CONTROLLING MEANS FOR COLOR KINESCOPE

SULFOXIDE COMPOUNDS AND PROCESS FOR PREPARING THE SAME

METHOD OF INCREASING YIELD OF A DIISOCYANATE

ORGANOSILICON COMPOUNDS