发明名称 IMAGE ANALYSIS MEASURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To enable to measure a target position of an image pattern to be measured in a sample paper at a high precision even when the sample paper is carried to a place being shifted from the target position on a measurement stage. <P>SOLUTION: This image analysis measuring device measures at least one item of the color density, the colorimetry value and the positional accuracy of an image on the sample paper which is mounted on the measurement stage. The image analysis measuring device is equipped with a position measuring means which measures the position of the sample paper which is mounted on the measurement stage, a measuring means which measures a specified measurement position on the sample paper depending on a measurement item, and a measurement position correcting means which corrects the measurement position of the measuring means depending on the position of the measured sample paper. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005059493(A) 申请公布日期 2005.03.10
申请号 JP20030294970 申请日期 2003.08.19
申请人 FUJI PHOTO FILM CO LTD 发明人 TAKAGI ATSUSHI
分类号 B41J29/46;G01B11/00;G01J3/46;G01N21/27;G06T1/00;H04N1/04 主分类号 B41J29/46
代理机构 代理人
主权项
地址