发明名称 Apparatus and method to improve the resolution of photolithography systems by improving the temperature stability of the reticle
摘要 A mask for use in a photolithographic process. The mask includes a plate or substrate having first and second opposite surfaces, a first image on the first surface of the substrate and a second image on the second surface of the substrate. When the mask is used in a photolithographic process, energy is reflected by the first image prior to entering the substrate and energy is reflected by the second image after passing through the substrate.
申请公布号 US2005053851(A1) 申请公布日期 2005.03.10
申请号 US20040942444 申请日期 2004.09.16
申请人 LSI LOGIC CORPORATION 发明人 BERMAN MICHAEL JAY;BAILEY GEORGE EDWARD
分类号 G03F1/14;G03F7/20;(IPC1-7):G03F9/00;G03C5/00;G21K5/00 主分类号 G03F1/14
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