发明名称 |
Apparatus and method to improve the resolution of photolithography systems by improving the temperature stability of the reticle |
摘要 |
A mask for use in a photolithographic process. The mask includes a plate or substrate having first and second opposite surfaces, a first image on the first surface of the substrate and a second image on the second surface of the substrate. When the mask is used in a photolithographic process, energy is reflected by the first image prior to entering the substrate and energy is reflected by the second image after passing through the substrate.
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申请公布号 |
US2005053851(A1) |
申请公布日期 |
2005.03.10 |
申请号 |
US20040942444 |
申请日期 |
2004.09.16 |
申请人 |
LSI LOGIC CORPORATION |
发明人 |
BERMAN MICHAEL JAY;BAILEY GEORGE EDWARD |
分类号 |
G03F1/14;G03F7/20;(IPC1-7):G03F9/00;G03C5/00;G21K5/00 |
主分类号 |
G03F1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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