NON-INVASIVE ELECTRIC-FIELD-DETECTION DEVICE AND METHOD

摘要

The invention relates to a device which is used for the non-invasive detection of an electric potential or field, or the spatial and/or temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device (1) comprises: an optical source (3) which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the light beam (7) of the zone to be probed. The aforementioned measuring means which are used to map the light beam (7) phase shift comprise a confocal microscope (15) in which the zone to be probed is placed in order to form an image of a plane of said zone.