发明名称 METHOD OF ETCHING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of etching semiconductor device by which the side wall of the step of a semiconductor device constituted of the principal surface and side wall of the device is etched. SOLUTION: The side wall of the step of the semiconductor device constituted of the principal surface and side wall of the device is etched, by controlling an impressing direction of a magnetic field or impressing directions of a magnetic field and an electric field upon etching species and by utilizing the reaction between the etching species and side wall. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005064035(A) 申请公布日期 2005.03.10
申请号 JP20030207352 申请日期 2003.08.12
申请人 MASUOKA FUJIO;SHARP CORP 发明人 MASUOKA FUJIO;HORII SHINJI;TANIGAMI TAKUJI;YOKOYAMA TAKASHI
分类号 H01J37/32;H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;H01L21/425;(IPC1-7):H01L21/306 主分类号 H01J37/32
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