发明名称 |
METHOD OF ETCHING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of etching semiconductor device by which the side wall of the step of a semiconductor device constituted of the principal surface and side wall of the device is etched. SOLUTION: The side wall of the step of the semiconductor device constituted of the principal surface and side wall of the device is etched, by controlling an impressing direction of a magnetic field or impressing directions of a magnetic field and an electric field upon etching species and by utilizing the reaction between the etching species and side wall. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005064035(A) |
申请公布日期 |
2005.03.10 |
申请号 |
JP20030207352 |
申请日期 |
2003.08.12 |
申请人 |
MASUOKA FUJIO;SHARP CORP |
发明人 |
MASUOKA FUJIO;HORII SHINJI;TANIGAMI TAKUJI;YOKOYAMA TAKASHI |
分类号 |
H01J37/32;H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;H01L21/425;(IPC1-7):H01L21/306 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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