发明名称 EXPOSURE APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an exposure apparatus capable of aligning with high accuracy and a small variance of errors. SOLUTION: A platen 3 is moved for aligning and the positions of a substrate mark 10 and a mask mark 20 are identified to detect the errorΔD between the marks. Whether theΔD is less than a tolerance D1 or not is decided by a deciding device 7, and ifΔD<D1, a decision device 8 decides to proceed exposure. IfΔD>D1, aligning and deciding are repeated for specified times. If the error remains asΔD>D1 even after repeating the procedure for the specified times, whetherΔD is less than D2 or not is decided. IfΔD<D2, to proceed exposure is decided. IfΔD>D2, the substrate W is ejected out of the system. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005062706(A) 申请公布日期 2005.03.10
申请号 JP20030295746 申请日期 2003.08.20
申请人 ADTEC ENGINEENG CO LTD 发明人 KUMAGAI KENICHI;HASEGAWA KOJI
分类号 G03F9/00;(IPC1-7):G03F9/00 主分类号 G03F9/00
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