A METHOD FOR MEASURING DIFFRACTION PATTERNS FROM A TRANSMISSION ELECTRON MICROSCOPY TO DETERMINE CRYSTAL STRUCTURES AND A DEVICE THEREFOR

摘要

The present invention relates to a device and method which enable a transmission electron microscope to measure very precisely electron diffraction patterns of a sample, said patterns suitable for structure determination therefrom, wherein the electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.