发明名称 MEASURING METHOD FOR CRYSTAL LATTICE CONSTANT BY CONVERGENCE ELECTRON DIFFRACTION
摘要 PROBLEM TO BE SOLVED: To provide a convergence electron diffraction measuring method capable of measuring all of six parameters of lattice constants in a microregion. SOLUTION: In this convergence electron diffraction method for acquiring a disc-shaped diffraction figure, by making electron beams converge and irradiate to a sample, all of six (a, b, c, α, β, γ) lattice constants of a crystal can be measured from the microregion smaller than 10 nm, from the distance between the intersection points of HOLZ line appearing in a transmission disc. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005062054(A) 申请公布日期 2005.03.10
申请号 JP20030294210 申请日期 2003.08.18
申请人 ASAHI KASEI CORP 发明人 AKAOGI TAKAYUKI;TERAUCHI MASAMI;TSUDA KENJI
分类号 G01N23/20;(IPC1-7):G01N23/20 主分类号 G01N23/20
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