发明名称 METHOD OF FABRICATING A DOUBLE GATE FIELD EFFECT TRANSISTOR DEVICE, AND SUCH A DOUBLE GATE FIELD EFFECT TRANSISTOR DEVICE
摘要 <p>The present invention discloses a method of forming a double gate field effect transistor device, and such a device formed with the method. One starts with a semiconductor-on-insulator substrate, and forms a first gate, source, drain and extensions, and prepares the second gate. Then the substrate is bonded to a second carrier, exposing a second side of the semiconductor layer. Next, an annealing step is performed as a diffusionless annealing, which has the advantage that the semiconductor layer not only has a substantially even thickness, but also has a substantially flat surface. This ensures the best possible annealing action of said annealing step. Very sharp abruptness of the extensions is achieved, with very high activation of the dopants.</p>
申请公布号 WO2005022648(A1) 申请公布日期 2005.03.10
申请号 WO2004IB51454 申请日期 2004.08.12
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;SURDEANU, RADU CATALIN;PONOMAREV, YOURI 发明人 SURDEANU, RADU CATALIN;PONOMAREV, YOURI
分类号 H01L21/336;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/336
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