发明名称 |
METHOD FOR TREATING WAFER USING LASER TO PREVENT PARTICLE AND STAIN BY FORMING WATER LAYER IN LASER PROCESS |
摘要 |
PURPOSE: A method for process a wafer using laser is provided to prevent particles and a stain generating in a laser treatment by forming a water membrane on the surface of wafer with deionized water. CONSTITUTION: A water membrane having a predetermined thickness is formed by injecting continuously deionized water parallel to the surface of a wafer. The surface of the wafer is processed by a laser. The water membrane is removed by injecting a deactivation gas on the surface of the wafer. Particles generating in a laser treatment are removed by injecting the deionized water at a predetermined angle to the surface of the wafer.
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申请公布号 |
KR20050023631(A) |
申请公布日期 |
2005.03.10 |
申请号 |
KR20030060877 |
申请日期 |
2003.09.01 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
OH, BANG WON;YI, KUK HWEA;YOON, JEONG GOO |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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