发明名称 METHOD FOR TREATING WAFER USING LASER TO PREVENT PARTICLE AND STAIN BY FORMING WATER LAYER IN LASER PROCESS
摘要 PURPOSE: A method for process a wafer using laser is provided to prevent particles and a stain generating in a laser treatment by forming a water membrane on the surface of wafer with deionized water. CONSTITUTION: A water membrane having a predetermined thickness is formed by injecting continuously deionized water parallel to the surface of a wafer. The surface of the wafer is processed by a laser. The water membrane is removed by injecting a deactivation gas on the surface of the wafer. Particles generating in a laser treatment are removed by injecting the deionized water at a predetermined angle to the surface of the wafer.
申请公布号 KR20050023631(A) 申请公布日期 2005.03.10
申请号 KR20030060877 申请日期 2003.09.01
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 OH, BANG WON;YI, KUK HWEA;YOON, JEONG GOO
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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