发明名称 ELECTRICAL DIE SORTING TEST SYSTEM TO REDUCE TIME REQUIRED TO MEASUREMENT BY MONITORING VOLTAGE IN REAL TIME
摘要 PURPOSE: EDS(Electrical Die Sorting) test system is provided to reduce the time and the man power required to measurement by monitoring a voltage in real time with a voltage measuring device. CONSTITUTION: EDS test system includes a prober system, a power supply unit and a voltage measuring device. The power supply unit is located within the prober system. The voltage measuring device measures a voltage of the voltage supply unit. The voltage measuring device comprises a measuring unit and a plurality of display units. The measuring unit is connected with voltage check terminals of the voltage supply unit and a common ground terminal. The plurality of display units connected electrically with the measuring unit monitors the respective voltage of the voltage check terminal by measuring in real time.
申请公布号 KR20050023706(A) 申请公布日期 2005.03.10
申请号 KR20030061090 申请日期 2003.09.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, JUN SU
分类号 H01L21/66;G01R31/30;(IPC1-7):H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址