发明名称 |
ELECTRICAL DIE SORTING TEST SYSTEM TO REDUCE TIME REQUIRED TO MEASUREMENT BY MONITORING VOLTAGE IN REAL TIME |
摘要 |
PURPOSE: EDS(Electrical Die Sorting) test system is provided to reduce the time and the man power required to measurement by monitoring a voltage in real time with a voltage measuring device. CONSTITUTION: EDS test system includes a prober system, a power supply unit and a voltage measuring device. The power supply unit is located within the prober system. The voltage measuring device measures a voltage of the voltage supply unit. The voltage measuring device comprises a measuring unit and a plurality of display units. The measuring unit is connected with voltage check terminals of the voltage supply unit and a common ground terminal. The plurality of display units connected electrically with the measuring unit monitors the respective voltage of the voltage check terminal by measuring in real time.
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申请公布号 |
KR20050023706(A) |
申请公布日期 |
2005.03.10 |
申请号 |
KR20030061090 |
申请日期 |
2003.09.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, JUN SU |
分类号 |
H01L21/66;G01R31/30;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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主权项 |
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