发明名称 |
METHOD AND APPARATUS FOR PRECISION MEASUREMENT OF PHASE SHIFTS |
摘要 |
<p>An interferometer (1) includes a beam displacing assembly (5, 9). The beam displacing assembly is arranged to split an input beam (4) into first and second basis beams (6, 8), that have orthogonal polarisations being respective horizontal and vertical polarizations, and to combine said basis beams to produce an output beam (12). A polarimetric phase retrieval assembly (11) is responsive to the output beam and is arranged to determine a difference in phase shift imparted to one of the basis beams (6, 7) relative to the other by a test piece (7). Other embodiments of the invention are arranged to produce basis beams that have respectively orthogonal spatial modes.</p> |
申请公布号 |
WO2005022078(A1) |
申请公布日期 |
2005.03.10 |
申请号 |
WO2004AU01160 |
申请日期 |
2004.08.27 |
申请人 |
THE UNIVERSITY OF QUEENSLAND;WHITE, ANDREW, GERARD;HARVEY, MICHAEL, DAVID |
发明人 |
WHITE, ANDREW, GERARD;HARVEY, MICHAEL, DAVID |
分类号 |
G01N21/45;G01J4/04;(IPC1-7):G01B9/02 |
主分类号 |
G01N21/45 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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