发明名称 |
Halbleitereinrichtung und Herstellungsverfahren einer Halbleitereinrichtung |
摘要 |
<p>The module includes several contact sections on a substrate surface (1) which comprises an insulating layer (2,3,5) deposited on the substrate surface. A conductive section (6) with a contact section (6a) is located in the insulating layer near the main surface of the semiconductor substrate. A silicon nitride layer (4) covers the substrate main surface and the conductive section is deposited in the insulating layer. Through the insulating layer and the silicon nitride layer runs a conductive path up to the contact section. Preferably the insulating layer contains a conductor (10) coupled by a conductive path to one contact section (1b) of the semiconductor substrate.</p> |
申请公布号 |
DE19655076(B4) |
申请公布日期 |
2005.03.10 |
申请号 |
DE1996155076 |
申请日期 |
1996.07.23 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO |
发明人 |
EIMORI, TAKAHISA;KIMURA, HIROSHI |
分类号 |
H01L21/283;H01L21/768;H01L23/522;H01L27/108;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|