发明名称 Halbleitereinrichtung und Herstellungsverfahren einer Halbleitereinrichtung
摘要 <p>The module includes several contact sections on a substrate surface (1) which comprises an insulating layer (2,3,5) deposited on the substrate surface. A conductive section (6) with a contact section (6a) is located in the insulating layer near the main surface of the semiconductor substrate. A silicon nitride layer (4) covers the substrate main surface and the conductive section is deposited in the insulating layer. Through the insulating layer and the silicon nitride layer runs a conductive path up to the contact section. Preferably the insulating layer contains a conductor (10) coupled by a conductive path to one contact section (1b) of the semiconductor substrate.</p>
申请公布号 DE19655076(B4) 申请公布日期 2005.03.10
申请号 DE1996155076 申请日期 1996.07.23
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO 发明人 EIMORI, TAKAHISA;KIMURA, HIROSHI
分类号 H01L21/283;H01L21/768;H01L23/522;H01L27/108;(IPC1-7):H01L21/283 主分类号 H01L21/283
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