| 摘要 |
A semiconductor laser device has a ridge portion composed of a cladding layer and a cap layer laid on top of the cladding layer, and a filling layer formed on opposite lateral sides of the ridge portion. A top surface of the cap layer and a top surface of the filling layer meet at an angle of 135° or larger but not larger than 180° on an upper side of the cap layer. In manufacturing the device, after a filling layer is formed so as to cover the ridge portion, an insulating film is formed and a portion above the ridge portion is selectively removed from the insulating film to expose the filling layer. Then, the exposed filling layer is removed till a top surface of the ridge portion is exposed.
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