Test arrangement for an integrated circuit,申请号EP20010000351-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Test arrangement for an integrated circuit
摘要
申请公布号	EP1179737(B1)	申请公布日期	2005.03.09
申请号	EP20010000351	申请日期	2001.08.07
申请人	PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;KONINKLIJKE PHILIPS ELECTRONICS N.V.	发明人	HAPKE, FRIEDRICH;SOLBACH, RUEDIGER;GLOWATZ, ANDREAS
分类号	G01R31/28;G01R31/317;G01R31/3185;(IPC1-7):G01R31/318;G01R31/318	主分类号	G01R31/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Method and apparatus for dynamic image data transmission

Method and apparatus for reordering complex SQL queries containing inner and outer join operations

Group management control method for elevator system employing traffic flow estimation by fuzzy logic using variable value preferences and decisional priorities

Method for extracting electrode and cantilever for AFM using said method for extracting electrode

ACOUSTIC SIGNAL PROCESSING DEVICE

Method and system for optimizing illumination in an optical photolithography projection imaging system

Dram system with control data

Ultrasonic elasticity imaging method and device

Methods and apparatus for controlling a refrigerator in normal and overload modes

Web splicing apparatus

Optoelectronic integrated device

Edge-biased magnetoresistive sensor

'Tift 94' Bermudagrass

Process for producing cordierite ceramic body

Device for performing urease tests on combined antrum/corpus biopsies to diagnose gastrointestinal illnesses

Sheet feeding apparatus having a feeding tray and paper feeding method

IMPROVEMENT OF ENZYMATIC COUPLING REACTION OF N-PROTECTED-L-ASPARTIC ACID WITH PHENYLALANINE METHYL ESTER

Echocardiographic examination table

Brake assembly for a motor