发明名称 Program voltage generation circuit for stably programming flash memory cell and method of programming flash memory cell
摘要 Provided are a program voltage generation circuit for achieving stable programming of a flash memory cell, and a method of programming a flash memory cell. In the program voltage generation circuit, a program wordline voltage to be applied to the gate of a flash memory cell is generated in response to a sink current provided by a constant current source and the result of a comparison between a reference voltage and a bitline voltage. The bitline voltage is generated according to a program current flowing to the first flash memory cell. A bitline current control voltage is generated in response to the program current that flows to a second flash memory cell in response to the program wordline voltage. Accordingly, even when the characteristics of the flash memory cell vary due to a change of a manufacturing process thereof, a constant program wordline voltage, a constant bitline voltage, and a constant bitline current control voltage are generated, and thus the flash memory cell is stably programmed.
申请公布号 US6865110(B1) 申请公布日期 2005.03.08
申请号 US20040810291 申请日期 2004.03.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JAE-KWAN
分类号 G11C8/08;G11C16/04;G11C16/12;(IPC1-7):G11C16/12 主分类号 G11C8/08
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