发明名称 High density, high frequency, board edge probe
摘要 A probe that connects test and measurement equipment to a device under test via a plurality of cables. The probe is formed of a plurality of printed circuit boards that are stacked together. Each board is connected to one of the plurality of cables and has a longitudinal set of pads along an edge electrically connected to the cable. The stacked plurality of printed circuit boards form a two dimensional array of pads for connecting to a similar set of pads on a device under test.
申请公布号 US6864696(B2) 申请公布日期 2005.03.08
申请号 US20020285223 申请日期 2002.10.31
申请人 AGILENT TECHNOLOGIES, INC. 发明人 LOGELIN DONALD M.;SELF BOB J.;WARDWELL ROBERT H.
分类号 G01R1/067;G01R1/073;(IPC1-7):G01R31/28 主分类号 G01R1/067
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