发明名称 Projection exposure methods and apparatus, and projection optical systems
摘要 Provided is a dioptric projection optical system favorably applicable to projection exposure apparatus used in the lithography step in fabrication of microdevices such as semiconductor devices. This projection optical system includes a positive, front lens unit (GF), an aperture stop (AS), and a positive, rear lens unit (GR) and is a bitelecentric optical system. The optical system satisfies the following condition:where f2 is a focal length of the rear lens unit (GR) and L is a distance between an object and an image.The projection optical system includes at least one aspheric surface (ASP 1 to ASP 6).
申请公布号 US6864961(B2) 申请公布日期 2005.03.08
申请号 US20030406223 申请日期 2003.04.04
申请人 NIKON CORPORATION 发明人 OMURA YASUHIRO
分类号 G02B13/14;G02B13/18;G02B13/22;G02B13/24;G03F7/20;(IPC1-7):G03B27/54;G03B27/42;G02B9/60 主分类号 G02B13/14
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