发明名称 |
SPUTTERING EQUIPMENT WITH ARGON-IMPLANTED DUAL BELLOWS TO RAPIDLY CHECK DAMAGE OF BELLOWS AND AVOID INFLUENCE UPON PROCESS EVEN WHEN BELLOWS IS DAMAGED |
摘要 |
PURPOSE: Sputtering equipment with an argon-implanted dual bellows is provided to rapidly check the damage of a bellows and avoid an influence upon a process even when the bellows is damaged by installing a leak detecting unit between an internal bellows and an external bellows. CONSTITUTION: A sputtering process is performed in a predetermined space of a chamber. A wafer placement part(13) is installed in the bottom of the chamber. One side of an up-down apparatus(15) is inserted into the chamber and the other side of the up-down apparatus is installed in the outside of the chamber so that the wafer placement part moves up/down. An internal bellows(21) avoids vacuum leak in the chamber according to the driving of the up-down apparatus, installed to surround the up-down apparatus. An external bellows(23) is separated from the internal bellows by a predetermined interval, installed to surround the internal bellows. A gas injection hole(25) injects argon gas to a gap between the internal bellows and the external bellows. A leak detecting unit(27) is installed between the internal bellows and the external bellows.
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申请公布号 |
KR20050022473(A) |
申请公布日期 |
2005.03.08 |
申请号 |
KR20030060921 |
申请日期 |
2003.09.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, JONG WOO;KIM, HYO JUNE;KIM, JIN BOK |
分类号 |
H01L21/203;(IPC1-7):H01L21/203 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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