发明名称 |
Semiconductor socket and method of replacement of its probes |
摘要 |
A semiconductor socket is provided which includes a stage used for positioning of a semiconductor device. The semiconductor device has a plurality of external input/output terminals mounted at a bottom thereof. The semiconductor socket also has a plurality of probes used to come into contact with the plurality of external input/output terminals when the semiconductor device has been positioned, by moving the stage towards the probes. The semiconductor socket has a socket base in which a major portion of each of the probes is housed, and from which a minor portion of each of the probes projects from an upper face thereof. The upper face of the socket base faces the stage. The probes are disposed in a manner so as to be inserted in or pulled out from the upper face. The semiconductor socket has a probe retaining cap removably mounted to the upper face of the socket base, for preventing the probes from being removed. A method of replacing the probes is also proposed.
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申请公布号 |
US6863541(B2) |
申请公布日期 |
2005.03.08 |
申请号 |
US20030421827 |
申请日期 |
2003.04.24 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
KAGAMI SUMIO |
分类号 |
G01R31/26;G01R1/073;H01R13/24;H01R33/76;(IPC1-7):H01R12/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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