发明名称 BEAM QUALITY IMPROVEMENT APPARATUS IN PROCESS FOR FOCALIZING BEAMS ON EXTRACTION ELECTRODE AND ACCELERATION ELECTRODE HEAD
摘要 PURPOSE: A beam quality improvement apparatus in process is provided to stabilize a fabrication process, reduce a process time, and improve a throughput by reducing a blow-up phenomenon due to beam current loss and increasing beam purity. CONSTITUTION: An arc chamber(16) is used for ionizing internal gas. An arc slit(18) is attached to the arc chamber. The ionized beams are irradiated to the outside of the arc slit. A suppression electrode(22) is used for transmitting the beams through the arc slit. A ground electrode(24b) is used for transmitting the ionized beams through the suppression electrode. An insulator(28) is attached to an inner surface of the suppression electrode. A graphite part(26) is attached to the insulator in order to prevent abrasion of the arc slit, the suppression electrode, and the ground electrode.
申请公布号 KR20050022789(A) 申请公布日期 2005.03.08
申请号 KR20030060517 申请日期 2003.08.30
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 HAN, BYOUNG JUN
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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