APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICES CAPABLE OF CHANGING FREQUENCY OF TEST PATTERN SIGNALS SELECTIVELY BY INCLUDING FREQUENCY CHANGING PARTS

摘要

PURPOSE: An apparatus and a method for testing a semiconductor memory device are provided to test the semiconductor memory device that has high operation frequency by changing frequency of test pattern signals selectively. CONSTITUTION: An apparatus(200) for testing a semiconductor memory device comprises a main tester(201); an input frequency changing part(202) for changing the first input test pattern signals(DR1-DRN) to a second input test pattern signals(DRS1-DRST) of the second frequency in response to a first program control signal; an output frequency changing part(203) for changing the second output test pattern signals(CPS1-CPST) of the second frequency to the first output test pattern signals(CP1-CPN) in response to the second program control signal. Wherein, the first input test pattern signals(DR1-DRN) are the first parallel data signals of low frequency, the second input test pattern signals(DRS1-DRST) are the first serial data signals of high frequency, the second output test pattern signals(CPS1-CPST) are the second serial data signals of high frequency, and the first output test pattern signals(CP1-CPN) are the second parallel data signals of low frequency.