发明名称 SEMICONDUCTOR MEMORY DEVICE AND FABRICATING METHOD THEREOF TO IMPROVE CURRENT DRIVING ABILITY
摘要 PURPOSE: A semiconductor memory device is provided to improve a current driving ability by lowering the threshold voltage of a driver MOS(metal oxide semiconductor) transistor and/or an access MOS transistor in driving an SRAM(static random access memory) cell having a wordline with an increased potential. CONSTITUTION: An access MOS transistor and a driver MOS transistor are prepared. An SRAM cell includes a contact that connects a wordline with a gate electrode of the access MOS transistor. The contact is electrically connected to at least one body region of the access MOS transistor or the driver MOS transistor.
申请公布号 KR20050021928(A) 申请公布日期 2005.03.07
申请号 KR20040068029 申请日期 2004.08.27
申请人 RENESAS TECHNOLOGY CORP. 发明人 HIRANO YUUICHI;IPPOSHI TAKASHI;MAEGAWA SHIGETO;NII KOJI
分类号 H01L27/11;G11C8/02;H01L21/8244;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L27/11 主分类号 H01L27/11
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