发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND FABRICATING METHOD THEREOF TO IMPROVE CURRENT DRIVING ABILITY |
摘要 |
PURPOSE: A semiconductor memory device is provided to improve a current driving ability by lowering the threshold voltage of a driver MOS(metal oxide semiconductor) transistor and/or an access MOS transistor in driving an SRAM(static random access memory) cell having a wordline with an increased potential. CONSTITUTION: An access MOS transistor and a driver MOS transistor are prepared. An SRAM cell includes a contact that connects a wordline with a gate electrode of the access MOS transistor. The contact is electrically connected to at least one body region of the access MOS transistor or the driver MOS transistor.
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申请公布号 |
KR20050021928(A) |
申请公布日期 |
2005.03.07 |
申请号 |
KR20040068029 |
申请日期 |
2004.08.27 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
HIRANO YUUICHI;IPPOSHI TAKASHI;MAEGAWA SHIGETO;NII KOJI |
分类号 |
H01L27/11;G11C8/02;H01L21/8244;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L27/11 |
主分类号 |
H01L27/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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