发明名称 |
NEUTRON UNIFORMIZATION METHOD IN RADIAL DIRECTION IN NEUTRON TRANSMUTATION DOPING PROCESS TO FABRICATE SEMICONDUCTOR MATERIAL HAVING GENERALLY THE SAME RESISTIVITY |
摘要 |
PURPOSE: A neutron uniformization method in a dial direction in a neutron transmutation doping process is provided to fabricate a semiconductor material having generally the same resistivity by making the neutron flux uniform in the center and the periphery of a silicon ingot. CONSTITUTION: After a plurality of neutron scattering layers are interposed between a plurality of silicon ingots at regular intervals(S112), neutrons are irradiated in a reactor to make the neutron flux uniform in the center part and the peripheral part of the silicon ingots through scattering of neutrons of the neutron scattering layer.
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申请公布号 |
KR20050021737(A) |
申请公布日期 |
2005.03.07 |
申请号 |
KR20030058898 |
申请日期 |
2003.08.25 |
申请人 |
SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION |
发明人 |
KANG, CHANG MU;PARK, CHANG SOO |
分类号 |
C30B29/06;(IPC1-7):C30B29/06 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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