发明名称 |
METHOD FOR FABRICATING POLYCRYSTALLINE SILICON TFT TO IMPROVE TFT CHARACTERISTIC AND EMBODY UNIFORM TFT CHARACTERISTIC |
摘要 |
PURPOSE: A method for fabricating a polycrystalline silicon TFT(thin film transistor) is provided to improve a TFT characteristic and embody a uniform TFT characteristic by patterning an amorphous silicon layer of a particular type before irradiation of excimer laser and by removing generation of a protrusion formed by crystallization in both directions. CONSTITUTION: A buffer layer and an amorphous silicon layer(33) are consecutively formed on an insulated glass substrate. A dehydrogenation process is performed on the amorphous silicon layer. The amorphous silicon layer is selectively patterned. Excimer laser is irradiated to the inside of the patterned amorphous silicon layer to crystallize the pattern amorphous silicon layer.
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申请公布号 |
KR20050022086(A) |
申请公布日期 |
2005.03.07 |
申请号 |
KR20030058731 |
申请日期 |
2003.08.25 |
申请人 |
BOE HYDIS TECHNOLOGY CO., LTD. |
发明人 |
LEE, HO NYEON;LEE, JUN HO;PARK, JAE CHUL;SON, KYOUNG SEOK |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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