发明名称 PROGRAM VOLTAGE GENERATING CIRCUIT AND PROGRAMMING METHOD OF FLASH MEMORY CELL FOR SAFE PROGRAMMING OF FLASH MEMORY CELL BY GENERATING PROGRAM WORD LINE VOLTAGE IN REFERENCE VOLTAGE LEVEL
摘要 PURPOSE: A program voltage generating circuit and a programming method of a flash memory cell are provided to get stable program word line voltage, bit line voltage, and bit line current control voltage regardless of a process change by generating the program word line voltage in a reference voltage level. CONSTITUTION: A program voltage generating circuit(900) comprises a constant current source for supplying a sink current; a program word line voltage generating part(910) for generating a program word line voltage(Vwl) which is applied to a gate of the first flash memory cell in response to a comparison result of the sink current with the reference voltage(Vref) and the bit line voltage(Vbl); a bit line voltage generating part(920) for generating a bit line voltage(Vbl) according to the program current(Ipgm) in the first flash memory cell; a bit line current control voltage generating part for generating a bit line current control voltage in response to the program current in the second flash memory cell in response to the program word line voltage.
申请公布号 KR20050020865(A) 申请公布日期 2005.03.04
申请号 KR20030058253 申请日期 2003.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JAE KWAN
分类号 G11C8/08;G11C16/04;G11C16/12;(IPC1-7):G11C16/12 主分类号 G11C8/08
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