发明名称 |
PROGRAM VOLTAGE GENERATING CIRCUIT AND PROGRAMMING METHOD OF FLASH MEMORY CELL FOR SAFE PROGRAMMING OF FLASH MEMORY CELL BY GENERATING PROGRAM WORD LINE VOLTAGE IN REFERENCE VOLTAGE LEVEL |
摘要 |
PURPOSE: A program voltage generating circuit and a programming method of a flash memory cell are provided to get stable program word line voltage, bit line voltage, and bit line current control voltage regardless of a process change by generating the program word line voltage in a reference voltage level. CONSTITUTION: A program voltage generating circuit(900) comprises a constant current source for supplying a sink current; a program word line voltage generating part(910) for generating a program word line voltage(Vwl) which is applied to a gate of the first flash memory cell in response to a comparison result of the sink current with the reference voltage(Vref) and the bit line voltage(Vbl); a bit line voltage generating part(920) for generating a bit line voltage(Vbl) according to the program current(Ipgm) in the first flash memory cell; a bit line current control voltage generating part for generating a bit line current control voltage in response to the program current in the second flash memory cell in response to the program word line voltage.
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申请公布号 |
KR20050020865(A) |
申请公布日期 |
2005.03.04 |
申请号 |
KR20030058253 |
申请日期 |
2003.08.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JAE KWAN |
分类号 |
G11C8/08;G11C16/04;G11C16/12;(IPC1-7):G11C16/12 |
主分类号 |
G11C8/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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