发明名称 Semiconductor device with silicon-germanium gate electrode and method for manufacturing thereof
摘要 A semiconductor includes a gate electrode having a SiGe film on a a gate dielectric film that is on a silicon substrate. The gate dielectric film includes an underlying interfacial layer on the substrate, and a high-k dielectric film having higher dielectric constant than the underlying interfacial layer. The gate electrode includes a seed Si film on the high-k dielectric film and a SiGe film formed on the seed Si film. The seed Si film has a thickness of 0.1 nm or more and smaller than 5 nm.
申请公布号 US2005045938(A1) 申请公布日期 2005.03.03
申请号 US20040925990 申请日期 2004.08.26
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. 发明人 MUTOU AKIYOSHI;OHJI HIROSHI
分类号 H01L29/423;H01L21/28;H01L21/314;H01L21/336;H01L21/8238;H01L29/49;H01L29/51;H01L29/78;(IPC1-7):H01L29/15 主分类号 H01L29/423
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