发明名称 |
Semiconductor device with silicon-germanium gate electrode and method for manufacturing thereof |
摘要 |
A semiconductor includes a gate electrode having a SiGe film on a a gate dielectric film that is on a silicon substrate. The gate dielectric film includes an underlying interfacial layer on the substrate, and a high-k dielectric film having higher dielectric constant than the underlying interfacial layer. The gate electrode includes a seed Si film on the high-k dielectric film and a SiGe film formed on the seed Si film. The seed Si film has a thickness of 0.1 nm or more and smaller than 5 nm.
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申请公布号 |
US2005045938(A1) |
申请公布日期 |
2005.03.03 |
申请号 |
US20040925990 |
申请日期 |
2004.08.26 |
申请人 |
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. |
发明人 |
MUTOU AKIYOSHI;OHJI HIROSHI |
分类号 |
H01L29/423;H01L21/28;H01L21/314;H01L21/336;H01L21/8238;H01L29/49;H01L29/51;H01L29/78;(IPC1-7):H01L29/15 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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