发明名称 |
Heat treatment apparatus of light-emission type and method of cleaning same |
摘要 |
After the maintenance of a heat treatment apparatus, a susceptor and a heating plate are moved upwardly and a flow of nitrogen gas from an inlet passage toward an outlet passage is produced prior to the heat treatment of a semiconductor wafer. In this state, flash lamps are turned on to cause the momentary expansion and contraction of the gas in a chamber, thereby scattering particles deposited on a bottom plate and the like. The scattered particles are removed by the flow of nitrogen gas passing through a bottom portion of the chamber and discharged outwardly through the outlet passage. The particles in the chamber are easily removed only by turning on the flash lamps a predetermined number of times at fixed time intervals while producing such a flow of nitrogen gas. This provides the heat treatment apparatus of a light-emission type and a method of cleaning the heat treatment apparatus capable of easily removing the particles in the chamber.
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申请公布号 |
US2005047767(A1) |
申请公布日期 |
2005.03.03 |
申请号 |
US20040926639 |
申请日期 |
2004.08.26 |
申请人 |
DAINIPPON SCREEN MFG. CO., LTD. |
发明人 |
NOZAKI YOSHIHIDE |
分类号 |
F27B17/00;F27B5/14;F27D5/00;F27D11/00;F27D11/02;F27D17/00;H01L21/00;H01L21/26;(IPC1-7):F27B5/14 |
主分类号 |
F27B17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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