首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHODS AND APPARATUS FOR MONITORING PLASMA PARAMETERS IN PLASMA DOPING SYSTEMS
摘要
申请公布号
KR20050019932(A)
申请公布日期
2005.03.03
申请号
KR20057001436
申请日期
2005.01.26
申请人
发明人
分类号
H01J37/32;(IPC1-7):H01J37/32
主分类号
H01J37/32
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Bus slot conversion module
Method and system for high-speed multiplication
Secure data storage on open systems
Flexible system simulation architecture, its interface and operating method
Method and device for the hysteresis correction of measured values for sensors with extensometers
Method and apparatus for arithmetic coding, including probability estimation state table creation
Local invalidation buses for a highly scalable shared cache memory hierarchy
Sampling statistics in a database system
Tunnel monitoring system in a vehicle tunnel
Situation dependent lateral terrain maps for avionics displays
Flexible device for topical application of PDT
Device and method for measuring the diameter of an air passageway
Process for producing polyester resins
Composite foam made from polymer microspheres reinforced with long fibers
Power transfer apparatus
Golf club
Fastener having recess useable with multiple drivers and method of manufacture
TRANSMITTER PHOTONIC INTEGRATED CIRCUITS (TxPIC) AND OPTICAL TRANSPORT NETWORKS EMPLOYING TxPICs
TETRACYCLIC ARYLSULFONYL INDOLES HAVING SEROTONIN RECEPTOR AFFINITY
METHOD OF MANUFACTURING AN ACCELEROMETER