| 摘要 |
PROBLEM TO BE SOLVED: To provide a serial access memory and a data write/read method in which a test time is reduced. SOLUTION: Stored data of memory cells MC11 to MCm1 connected to a word line WL1 are simultaneously transferred to read registers Rreg-1 to Rreg-m and then, stored data of memory cells MC12 to MCm2 connected to a word line WL2 are simultaneously transferred to write registers Wreg-1 to Wreg-m. Data stored in the read registers are transmitted to an output means 123 through read data buses RD, /RD. Data stored in the write registers are transmitted to the output means 123 through write data buses WD, /WD, an input output means 122 and second read data buses RD2, /RD2. The output means 123 compares the data transmitted from the read data buses RD, /RD and the data transmitted from the second read data buses RD2, /RD2. COPYRIGHT: (C)2005,JPO&NCIPI
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