发明名称 ASYMMETRICAL STATIC RANDOM ACCESS MEMORY ELEMENT HAVING REDUCED BIT LINE LEAKAGE
摘要 PROBLEM TO BE SOLVED: To provide an asymmetrical static random access memory element having reduced bit line leakage. SOLUTION: A SRAM device (100) includes a column having opposing bit lines (140), asymmetrical memory cells (120) spanning the opposing bit lines (140) in alternating orientations, and a sense amplifier (130). The sense amplifier (130) comprises sensing circuitry (160) configured to sense the values stored in the cells and switching circuitry (150) configured to apply signals to the sensing circuitry (160) as a function of the orientations. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005056558(A) 申请公布日期 2005.03.03
申请号 JP20040228835 申请日期 2004.08.05
申请人 TEXAS INSTRUMENTS INC 发明人 HOUSTON THEODORE W
分类号 G11C11/419;G11C7/06;G11C11/41;G11C11/413;(IPC1-7):G11C11/419 主分类号 G11C11/419
代理机构 代理人
主权项
地址