发明名称 CIRCUIT BOARD INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a circuit board inspection device capable of easily and precisely inspecting a circuit board of an inspection object. SOLUTION: This device comprises a contact type probe; a probe moving mechanism for enabling the tip Ha of the probe to make contact with a conductor pattern Pa of the circuit board; a measurement part for outputting a signal to the probe to measure the electrostatic capacity between the probe and a reference electrode; and a control part for controlling the probe moving mechanism and also inspecting the circuit board based on the measured electrostatic capacity. The control part executes a first measurement processing (step 21) for bringing the tip Ha of the probe into contact with the conductor pattern Pa to measure an electrostatic capacity C1; a second measurement processing (step 22) for bringing the tip Ha into contact therewith in an energized state to measure an electrostatic capacity C2; and a first calculation processing for calculating the differential value C3 between the electrostatic capacities C1 and C2. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005055211(A) 申请公布日期 2005.03.03
申请号 JP20030206410 申请日期 2003.08.07
申请人 HIOKI EE CORP 发明人 MURAYAMA RINTARO;SATO YOSHINORI
分类号 G01R31/02;G01R27/26;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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