| 摘要 |
<p>Noise detecting/measuring circuits may be imbedded and dispersed in a semiconductor integrated circuit comprising a plurality of circuit blocks for performing signal processings, and can capture the waveforms and spatial distributions of power supply/ground noises. The Noise detecting/measuring circuits can be formed by a manufacturing process of CMOS semiconductor integrated circuits. Each of the circuits for detecting noises of the power supply/ground wires comprises a source follower, a selection/read switch and a source-grounded amplifier. The circuit may be constituted by MOS transistors the number of which is only six or so, and can be appropriately laid out in an area that is a similar degree to the area of a small-sized logic gate circuit of a standard cell system. An output signal of the noise detecting circuit is read out by coupling an output current of the source-grounded amplifier to a current bus wire, amplifying it and further driving an external resistor load circuit. The plurality of noise detecting circuits can be parallel connected to the current bus wire and can be selectively read so as to perform multi-node noise measurements in the large scale integrated circuit.</p> |
