| 摘要 |
PROBLEM TO BE SOLVED: To execute in a short time a test for measuring a response characteristic of an IC to be tested by measuring the operable shortest period by changing the application period of a test pattern applied to the IC to be tested, so as to be gradually shortened. SOLUTION: This device is provided with a subtraction time setting means 60, a subtraction instruction signal CMD for instructing to subtract a subtraction time set in the subtraction time setting means from period data read out from a period data memory 20, a subtraction means for subtracting the subtraction time set in a subtraction time setting part from the period data read out from the period data memory 20 at every time when the subtraction instruction signal is outputted, transmitting the period data subjected to subtraction to a period generation means, and changing the application period of the test pattern following the subtraction time, and an integration means 62 for integrating the subtraction time synchronously with the subtraction operation by the subtraction means, and applying the integrated value to the subtraction means as a next-time subtraction value. COPYRIGHT: (C)2005,JPO&NCIPI
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