发明名称 Polishing apparatus and method
摘要 There are provided a polishing apparatus and a polishing method capable of performing polishing a work (such as a wafer) with high efficiency and high precision, a novel work holding plate effectively holding a work and an adhering method for a work capable of adhering the work on the work holding plate with high precision. The polishing apparatus comprises: a polishing table(29); and a work holding plate(38), wherein a work held on the work holding plate(38) is polished supplying a polishing agent solution(41) in the apparatus, and in polishing action, an amount of deformation of the polishing table(29) in a direction normal to an upper surface thereof with respect to the upper surface thereof and/or an amount of deformation of the work holding plate(38) in a direction normal to a work holding surface thereof is restricted to 100 m or less by forming the polishing table(29) in one-piece, contriving flow paths of cooling water and others.
申请公布号 US2005048882(A1) 申请公布日期 2005.03.03
申请号 US20040964624 申请日期 2004.10.15
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 KIUCHI ETSUO;HAYASHI TOSHIYUKI
分类号 B24B37/015;B24B37/04;B24B37/12;B24B37/14;B24B37/30;B24B41/04;B24B41/06;B24B49/14;B24B55/02;B24B57/02;(IPC1-7):B24B5/00 主分类号 B24B37/015
代理机构 代理人
主权项
地址